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Publication Citation: Development of Environmental Scanning Electron Microscopy Electron Beam Profile Imaging with Self-assembled Monolayers and Secondary Ion Mass Spectroscopy

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Author(s): Scott A. Wight; John G. Gillen; Tonya Herne;
Title: Development of Environmental Scanning Electron Microscopy Electron Beam Profile Imaging with Self-assembled Monolayers and Secondary Ion Mass Spectroscopy
Published: February 03, 1997
Abstract:
Citation: Scanning
Volume: 19
Issue: 2
Pages: pp. 71 - 74
Research Areas: Thin-Films, Chemistry, Chemical Analysis, Composition, Mass Spectrometry