NIST Authors in Bold
| Author(s): | Scott A. Wight; John G. Gillen; Tonya Herne; |
|---|---|
| Title: | Development of Environmental Scanning Electron Microscopy Electron Beam Profile Imaging with Self-assembled Monolayers and Secondary Ion Mass Spectroscopy |
| Published: | February 03, 1997 |
| Abstract: | |
| Citation: | Scanning |
| Volume: | 19 |
| Issue: | 2 |
| Pages: | pp. 71 - 74 |
| Research Areas: | Thin-Films, Chemistry, Chemical Analysis, Composition, Mass Spectrometry |