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Development of Environmental Scanning Electron Microscopy Electron Beam Profile Imaging with Self-assembled Monolayers and Secondary Ion Mass Spectroscopy

Published

Author(s)

Scott A. Wight, John G. Gillen, Tonya Herne
Citation
Scanning
Volume
19
Issue
2

Citation

Wight, S. , Gillen, J. and Herne, T. (1997), Development of Environmental Scanning Electron Microscopy Electron Beam Profile Imaging with Self-assembled Monolayers and Secondary Ion Mass Spectroscopy, Scanning (Accessed April 18, 2024)
Created February 3, 1997, Updated February 19, 2017