NIST logo

Publication Citation: A Calibrated Atomic Force Microscope

NIST Authors in Bold

Author(s): T Mcwaid; J Schneir; Theodore V. Vorburger;
Title: A Calibrated Atomic Force Microscope
Published: January 01, 1994
Abstract: Abstract not available.
Proceedings: Proceedings of the 3rd International Conference on Ultraprecision in Manufacturing Engineering
Pages: pp. 342 - 345
Location: Aachen, -1
Dates: May 1, 1994
Research Areas: Metrology, Manufacturing