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Publication Citation: A Global View of Chemical Metrology: Recent Developments and Basic Concepts

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Author(s): Hratch G. Semerjian;
Title: A Global View of Chemical Metrology: Recent Developments and Basic Concepts
Published: December 16, 1997
Abstract:
Conference: 1st Interamerican Workshop on Metrology in Chemistry
Proceedings: Proceedings of the 1st Interamerican Workshop on Metrology in Chemistry
Location: Rio de Janeiro,
Dates: January 1, 0001
Research Areas: Chemistry