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Publication Citation: Quantitative Surface Analysis of Fe-Ni Alloy Films by XPS, AES and SIMS

NIST Authors in Bold

Author(s): David S. Simons; K. J. Kim; John G. Gillen; D Moon; H Jin; H Kang;
Title: Quantitative Surface Analysis of Fe-Ni Alloy Films by XPS, AES and SIMS
Published: May 21, 2007
Abstract:
Citation: Surface and Interface Analysis
Volume: 39
Issue: 8
Pages: pp. 665 - 673
Keywords: surface quantification, Fe-Ni Alloy, ICP-MS, C60 SIMS, isotope dilution method
Research Areas: Thin-Films, Composition, Surfaces, Mass Spectrometry