| Author(s): |
Steven D. Phillips; Craig M. Shakarji; Michael Krystek; K Summerhays; |
| Title: |
Dimensional measurement traceability of 3D imaging data |
| Published: |
January 19, 2009 |
| Abstract: |
This paper discusses the concept of metrological traceability to the SI unit of length, the meter. We describe how metrological traceability is realized, give a recent example of the standardization of laser trackers, and discuss progress and challenges to the traceability of 3D imaging data. |
| Conference: |
3D Imaging Metrology |
| Proceedings: |
Proceedings of SPIE Volume 7239 |
| Volume: |
7239 |
| Pages: |
pp. 72390E-72390E-7 - 72390E-7 |
| Location: |
San Jose, CA |
| Dates: |
January 19-20, 2009 |
| Keywords: |
traceability, calibration, dimensional metrology, simulation, laser scanning, laser tracker |
| Research Areas: |
Dimensional Metrology, Metrology, Manufacturing |
