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|Author(s):||Steven D. Phillips; Craig M. Shakarji; Michael Krystek; K Summerhays;|
|Title:||Dimensional measurement traceability of 3D imaging data|
|Published:||January 19, 2009|
|Abstract:||This paper discusses the concept of metrological traceability to the SI unit of length, the meter. We describe how metrological traceability is realized, give a recent example of the standardization of laser trackers, and discuss progress and challenges to the traceability of 3D imaging data.|
|Conference:||3D Imaging Metrology|
|Proceedings:||Proceedings of SPIE Volume 7239|
|Pages:||pp. 72390E-72390E-7 - 72390E-7|
|Location:||San Jose, CA|
|Dates:||January 19-20, 2009|
|Keywords:||traceability, calibration, dimensional metrology, simulation, laser scanning, laser tracker|
|Research Areas:||Dimensional Metrology, Metrology, Manufacturing|
|PDF version:||Click here to retrieve PDF version of paper (468KB)|