NIST logo

Publication Citation: Interaction of Surface Free Energy and Humidity on AFM Tip-Sample Adhesion Measured by Chemical Force Microscopy

NIST Authors in Bold

Author(s): Lei Chen; Tinh Nguyen; Xiaohong Gu; D Julthongpiput; Michael J. Fasolka; Jonathan W. Martin;
Title: Interaction of Surface Free Energy and Humidity on AFM Tip-Sample Adhesion Measured by Chemical Force Microscopy
Published: Date Unknown
Abstract:
Conference: Adhesion Society
Proceedings: Proceedings| 2006
Dates: February 1, 2006
Keywords: adhesion force;AFM;building technology;chemical force microscopy;chemical imaging;humidity;nanoscale;surface chemistry;surface energy
Research Areas: Building and Fire Research