Characterization of Multi-Phase and Multi-Component Polymer Systems Using the Atomic Force Microscope

Published

August 1, 1999

Author(s)

Mark R. VanLandingham, Xiaohong Gu, D T. Raghavan, Tinh Nguyen

Abstract

Recent advances have been made on two fronts regarding the capability of the atomic force microscope (AFM) to characterize the mechanical response of polymers. Phase imaging with the AFM has emerged as a powerful technique, providing contrast enhancement of topographic features in some cases and, in other cases, revealing hetrogeneities in the polymer microstructure. The capability of the AFM to measure nanoscale indentation response of polymers has also been explored recently. In this presentation, the use of the AFM to characterize multi-phase and multi-component polymer systems is discussed, with emphasis given to phase imaging and indentation results.

Proceedings Title

Proceedings of Microscopy and Microanalysis '99

Volume

5

Issue

No. 2

Conference Dates

August 1-5, 1999

Conference Location

Undefined

Conference Title

Microscopy and Microanalysis Journal

Pub Type

Conferences

Keywords

atomic force microscopy, coatings, nanoscale indentation, phase imaging, polymer blends, polymers, thin films

Citation

VanLandingham, M. , Gu, X. , Raghavan, D. and Nguyen, T. (1999), Characterization of Multi-Phase and Multi-Component Polymer Systems Using the Atomic Force Microscope, Proceedings of Microscopy and Microanalysis '99, Undefined (Accessed April 19, 2024)