| Author(s): |
Douglas T. Smith; Gordon A. Shaw; Richard Seugling; Jon R. Pratt; Dan Xiang; |
| Title: |
Traceable Micro-Force Calibration for Instrumented Indentation Testing |
| Published: |
February 13, 2007 |
| Abstract: |
We describe the development, performance and application of an accurate SI-traceable force calibration and verification system for potential use in the field calibration of commercial instrumented indentation testing (IIT) instruments. The system consists of a capacitive force sensor, small enough to mount in any commercial IIT instrument as if it were a test specimen, used in conjunction with an ultra-high-accuracy capacitance bridge and a simple data recording computer. The system is calibrated with NIST-traceable masses over the range 5.0 µN through 5.0 mN. We present data on its accuracy and precision, as well its potential application to the calibration and verification of force in commercial instrumented indentation instruments. |
| Citation: |
Materials Science and Technology |
| Keywords: |
nanoindentation; force calibration; hardness testing; |
| Research Areas: |
Nanomaterials |
