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Publication Citation: Development of a Seebeck Coefficient Standard Reference Material

NIST Authors in Bold

Author(s): Nathan Lowhorn; Winnie K. Wong-Ng; John Lu; Evan L. Thomas; Makoto Otani; Martin L. Green; Neil Dilley; Jeffrey Sharp; Thanh N. Tran;
Title: Development of a Seebeck Coefficient Standard Reference Material
Published: August 07, 2009
Abstract: We have successfully developed a Seebeck coefficient Standard Reference Material (SRM ), Bi2Te3, that is crucial for interlaboratory data comparison and for instrument calibration. Certification measurements were performed using two different techniques on 10 samples randomly selected from a batch of 390 bars. The certified Seebeck coefficient values are provided from 10K to 390K. The availability of this SRM will validate the measurement accuracy, leading to a better understanding of the structure/property relationships and the underlying physics of novel and improved thermoelectric materials. An overview of the measurement techniques and data analysis of this new SRM is given.
Citation: Applied Physics A-Materials Science & Processing
Volume: 96
Issue: 2
Pages: pp. 511 - 514
Keywords: NIST Seebeck Coefficient SRM , Bi2Te3, certification, metrology, thermoelectric materials
Research Areas: Semiconductors, Energy Conversion, Storage, and Transport, Energy
PDF version: PDF Document Click here to retrieve PDF version of paper (1MB)