| Author(s): |
Nathan Lowhorn; Winnie K. Wong-Ng; John Lu; Evan L. Thomas; Makoto Otani; Martin L. Green; Neil Dilley; Jeffrey Sharp; Thanh N. Tran; |
| Title: |
Development of a Seebeck Coefficient Standard Reference Material |
| Published: |
August 07, 2009 |
| Abstract: |
We have successfully developed a Seebeck coefficient Standard Reference Material (SRM ), Bi2Te3, that is crucial for interlaboratory data comparison and for instrument calibration. Certification measurements were performed using two different techniques on 10 samples randomly selected from a batch of 390 bars. The certified Seebeck coefficient values are provided from 10K to 390K. The availability of this SRM will validate the measurement accuracy, leading to a better understanding of the structure/property relationships and the underlying physics of novel and improved thermoelectric materials. An overview of the measurement techniques and data analysis of this new SRM is given. |
| Citation: |
Applied Physics A-Materials Science & Processing |
| Volume: |
96 |
| Issue: |
2 |
| Pages: |
pp. 511 - 514 |
| Keywords: |
NIST Seebeck Coefficient SRM ; Bi2Te3; certification; metrology; thermoelectric materials |
| Research Areas: |
Semiconductors, Energy Conversion, Storage, and Transport, Energy |
| PDF version: |
 Click here to retrieve PDF version of paper (1MB) |
