Publication Citation
NIST Authors in Bold
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| Author(s): | Yeon-Gil Jung; Regis J. Kline; Daniel A. Fischer; Eric K. Lin; Martin Heeney; Iain McCulloch; |
|---|---|
| Title: | The effect of interfacial roughness on the thin film morphology and charge transport of high performance polythiphenes |
| Published: | September 01, 2008 |
| Abstract: | |
| Citation: | Advanced Functional Materials |
| Volume: | 18 |
| Pages: | pp. 742 - 750 |
| Research Areas: | Characterization, Ceramics |
| PDF version: |  Click here to retrieve PDF version of paper (443KB) |