Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publication Citation: In-plane bias in a patterned ferromagnetic/antiferromagnetic bilayer

NIST Authors in Bold

Author(s): Yury P. Kabanov; Valerian I. Nikitenko; Oleg A. Tikhomirov; William F. Egelhoff Jr.; Alexander J. Shapiro; Robert D. Shull;
Title: In-plane bias in a patterned ferromagnetic/antiferromagnetic bilayer
Published: April 30, 2009
Abstract: Exchange bias in bi- and multilayer magnetic systems is usually ascribed to the existence of transient magnetic structures at the interfaces between adjacent layers. Here, we report the observation of a similar phenomenon in the lateral direction, indicated by an asymmetry in the magnetization reversal of a ferromagnetic film covered with a square grid of an antiferromagnetic layer. A canted orientation of the intrinsic anisotropy of the ferromagnet with respect to an induced exchange anisotropy and the presence of artificial stationary domain walls are discussed as likely origins of the effect.
Citation: Physical Review B (Condensed Matter and Materials Physics)
Pages: 7 pp.
Keywords: Magnetization reversal, Exchange bias, pattern structures
Research Areas: Nanomaterials
PDF version: PDF Document Click here to retrieve PDF version of paper (644KB)