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|Author(s):||Makoto Otani; Evan L. Thomas; Winnie K. Wong-Ng; Peter K. Schenck; Nathan Lowhorn; Martin L. Green; Hiroyuki Ohguchi;|
|Title:||A High-throughput Screening System for Thermoelectric Material Exploration Based on Combinatorial Film Approach|
|Published:||May 07, 2009|
|Abstract:||A high-throughput system that consists of a combinatorial tool (a sputtering deposition tool and a pulsed laser deposition tool) and two property screening devices, developed at NIST, was used for thermoelectric material exploration. The thermoelectric power factor (S2, S=Seebeck coefficient, electrical conductivity screening device allows us to measure electrical conductivity and Seebeck coefficient of over 1000 sample-points within 6 hours. The thermal effusivity measurement system using the frequency domain thermoreflectance technique allows us to screen thermal conductivity of combinatorial/conventional films. Illustrations of applications are provided with a Co-Sn-Ce/Si(100) film for power factor determination and with a Ba2YCu3O7/SrTiO3(100) film for thermal conductivity derivation.|
|Citation:||Japanese Journal of Applied Physics|
|Keywords:||Thermoconductivity screening tool, Combinatorial films, power factor screening tool|
|Research Areas:||Energy Conversion, Storage, and Transport, Ceramics, Energy|