| Author(s): |
Makoto Otani; Evan L. Thomas; Winnie K. Wong-Ng; Peter K. Schenck; Nathan Lowhorn; Martin L. Green; Hiroyuki Ohguchi; |
| Title: |
A High-throughput Screening System for Thermoelectric Material Exploration Based on Combinatorial Film Approach |
| Published: |
May 07, 2009 |
| Abstract: |
A high-throughput system that consists of a combinatorial tool (a sputtering deposition tool and a pulsed laser deposition tool) and two property screening devices, developed at NIST, was used for thermoelectric material exploration. The thermoelectric power factor (S2, S=Seebeck coefficient, electrical conductivity screening device allows us to measure electrical conductivity and Seebeck coefficient of over 1000 sample-points within 6 hours. The thermal effusivity measurement system using the frequency domain thermoreflectance technique allows us to screen thermal conductivity of combinatorial/conventional films. Illustrations of applications are provided with a Co-Sn-Ce/Si(100) film for power factor determination and with a Ba2YCu3O7/SrTiO3(100) film for thermal conductivity derivation. |
| Citation: |
Japanese Journal of Applied Physics |
| Volume: |
48 |
| Issue: |
5 |
| Pages: |
4 pp. |
| Keywords: |
Thermoconductivity screening tool; Combinatorial films, power factor screening tool |
| Research Areas: |
Energy Conversion, Storage, and Transport, Ceramics, Energy |
