Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Jaroslaw Grobelny; Frank W. DelRio; Pradeep N. Namboodiri; Doo-In Kim; Vincent A. Hackley; Robert F. Cook;|
|Title:||Size Measurement of Nanoparticles using Atomic Force Microscopy|
|Published:||October 01, 2009|
|Abstract:||In this assay protocol, procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imaging and height measurement via intermittent contact mode AFM are first described. The procedures for AFM calibration and operation to make such measurements are then discussed. Finally, the procedures for data analysis and reporting are provided. The example particles considered are National Institute of Standards and Technology (NIST) Au nanoparticle Reference Materials RM 8011 (nominally 10 nm particles), RM 8012 (30 nm), and RM 8013 (60 nm).|
|Citation:||NCL Assay Cascade Protocols|
|Keywords:||atomic force microscopy|
|Research Areas:||Nanotech/Environment, Health & Safety, Protocols, Atomic force microscopy (AFM), Nanomaterials, Characterization, Nanometrology, and Nanoscale Measurements|
|PDF version:||Click here to retrieve PDF version of paper (281KB)|