| Author(s): |
B D. Vogt; V. J. Lee; Vivek M. Prabhu; Dean M. DeLongchamp; Eric K. Lin; Wen-Li Wu; |
| Title: |
X-Ray and Neutron Reflectivity Measurements of Moisture Transport Through Model Multilayered Barrier Films for Oled Applications |
| Published: |
January 01, 2005 |
| Abstract: |
|
| Citation: |
Journal of Applied Physics |
| Volume: |
97 |
| Keywords: |
Electronic Materials;Nanostructured Materials;Reflectivity;Thin Films;interfaces;moisture barrier;reflectivity;thin films |
| Research Areas: |
Polymers |
| PDF version: |
 Click here to retrieve PDF version of paper (363KB) |
