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Publication Citation: Gradient Micropatterns for Surface Nanometrology and Thin Nanomaterials Development

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Author(s): Michael J. Fasolka; D Julthongpiput; Wenhua Zhang; Alamgir Karim; Eric J. Amis;
Title: Gradient Micropatterns for Surface Nanometrology and Thin Nanomaterials Development
Published: January 01, 2005
Abstract:
Conference: Pmse Preprint
Location: Washington, DC
Keywords: Combinatorial and THE Methods;Dewetting;Microscopy;SPM;Scanned Probe Microscopy;Thin Films;chemical micropatterns;combinatorial;high-throughput;surface energy gradient
Research Areas: Characterization, Nanomaterials
PDF version: PDF Document Click here to retrieve PDF version of paper (146KB)