| Author(s): |
Michael J. Fasolka; D Julthongpiput; Wenhua Zhang; Alamgir Karim; Eric J. Amis; |
| Title: |
Gradient Micropatterns for Surface Nanometrology and Thin Nanomaterials Development |
| Published: |
January 01, 2005 |
| Abstract: |
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| Conference: |
Pmse Preprint |
| Location: |
Washington, DC |
| Keywords: |
Combinatorial and THE Methods;Dewetting;Microscopy;SPM;Scanned Probe Microscopy;Thin Films;chemical micropatterns;combinatorial;high-throughput;surface energy gradient |
| Research Areas: |
Characterization, Nanomaterials |
| PDF version: |
 Click here to retrieve PDF version of paper (143KB) |
