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Publication Citation: Characterization of the In-Plane Structure of Buried Interfaces by Off-Specular X-Ray and Neutron Reflectometry

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Author(s): Kristopher Lavery; Vivek M. Prabhu; Eric K. Lin; Wen-Li Wu; Kwang-Woo Choi; Sushil K. Satija; M Wormington;
Title: Characterization of the In-Plane Structure of Buried Interfaces by Off-Specular X-Ray and Neutron Reflectometry
Published: February 14, 2008
Abstract: Off-specular reflectivity, or diffuse scattering, probes the lateral compositional variations at surfaces and interfaces. Of particular interest is the characterization at buried interfaces for the form and amplitude of roughness. Recent advances in modeling of the diffuse scattering proposes that contributions from physical roughness (topology) and gradients may be distinguished. Model substrates and buried interfaces were examined by a combination of neutron and x-ray off-specular reflectivity and atomic force microscopy to address these challenges. These three complementary methods, with different contrast mechanisms, highlight diffuse scattering as a versatile method to characterize buried interfacial structure.
Citation: Applied Physics Letters
Volume: 92
Keywords: off-specular reflectivity;polymer thin films;refectometry;roughness;surfaces and interfaces
Research Areas: Polymers, Neutron Research, Characterization, Materials Science, Soft Condensed Matter
PDF version: PDF Document Click here to retrieve PDF version of paper (396KB)