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|Author(s):||Kristopher Lavery; Vivek M. Prabhu; Eric K. Lin; Wen-Li Wu; Kwang-Woo Choi; Sushil K. Satija; M Wormington;|
|Title:||Characterization of the In-Plane Structure of Buried Interfaces by Off-Specular X-Ray and Neutron Reflectometry|
|Published:||February 14, 2008|
|Abstract:||Off-specular reflectivity, or diffuse scattering, probes the lateral compositional variations at surfaces and interfaces. Of particular interest is the characterization at buried interfaces for the form and amplitude of roughness. Recent advances in modeling of the diffuse scattering proposes that contributions from physical roughness (topology) and gradients may be distinguished. Model substrates and buried interfaces were examined by a combination of neutron and x-ray off-specular reflectivity and atomic force microscopy to address these challenges. These three complementary methods, with different contrast mechanisms, highlight diffuse scattering as a versatile method to characterize buried interfacial structure.|
|Citation:||Applied Physics Letters|
|Keywords:||off-specular reflectivity,polymer thin films,refectometry,roughness,surfaces and interfaces|
|Research Areas:||Polymers, Neutron Research, Characterization, Materials Science, Soft Condensed Matter|
|PDF version:||Click here to retrieve PDF version of paper (396KB)|