NIST Authors in Bold
| Author(s): | P M. McGuiggan; James J. Filliben; |
|---|---|
| Title: | High Throughput Measurement of Peel of a Pressure Sensitive Adhesive |
| Published: | January 01, 2006 |
| Abstract: | The peel force of a pressure sensitive adhesive (PSA) tape is measured on a surface that varied linearly in temperature. As the tape is peeled from the surface, the adhesive is peeled from a surface at a different temperature. The temperature can be correlated with peel distance, giving the temperature dependence of the peel force with one peel test. In addition, the transition from cohesive to interfacial shear could be easily identified, not only by the relative peak in the peel force, but also by the clearly visible adhesive layer which remained on the stainless steel plate. |
| Conference: | Pressure Sensitive Tape Council Proceedings |
| Proceedings: | Pressure Sensitive Tape Council (PSTC) Week of Learning 2006 | 29th | Pressure Sensitive Tape Council Technical Seminar Proceedings | PSTC |
| Volume: | 227 |
| Location: | Las Vegas, NV |
| Dates: | May 1-5, 2006 |
| Keywords: | adhesion;high throughput;peel;pressure sensitive adhesive;temperature gradient plate |
| Research Areas: | Characterization, Combinatorial Methods, Polymers |
| PDF version: | Click here to retrieve PDF version of paper (648KB) |