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Publication Citation: Gradient Chemical Micropatterns: A Reference Substrate for Surface Nanometrology

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Author(s): D Julthongpiput; Michael J. Fasolka; Wenhua Zhang; Tinh Nguyen; Eric J. Amis;
Title: Gradient Chemical Micropatterns: A Reference Substrate for Surface Nanometrology
Published: August 01, 2005
Abstract: We present fabrication routes for a new type of surface specimen that exhibits a micropattern with a gradient in chemical contrast between the pattern domains. Design elements in the specimen allow chemical contrast in the micropattern to be related to well-established surface characterization, like contact angle measurements. These gradient specimens represent a reference tool for calibrating image contrast in chemically-sensitive scanned probe microscopy techniques, and a platform for the high-throughput analysis of polymer thin film behavior.
Citation: Nano Letters
Volume: 5(8)
Keywords: chemical pattern;high-throughput analysis of thin film;SPM;surface energy gradient
Research Areas: Combinatorial Methods, Nanometrology
PDF version: PDF Document Click here to retrieve PDF version of paper (484KB)