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|Author(s):||D Julthongpiput; Michael J. Fasolka; Wenhua Zhang; Tinh Nguyen; Eric J. Amis;|
|Title:||Gradient Chemical Micropatterns: A Reference Substrate for Surface Nanometrology|
|Published:||August 01, 2005|
|Abstract:||We present fabrication routes for a new type of surface specimen that exhibits a micropattern with a gradient in chemical contrast between the pattern domains. Design elements in the specimen allow chemical contrast in the micropattern to be related to well-established surface characterization, like contact angle measurements. These gradient specimens represent a reference tool for calibrating image contrast in chemically-sensitive scanned probe microscopy techniques, and a platform for the high-throughput analysis of polymer thin film behavior.|
|Keywords:||chemical pattern,high-throughput analysis of thin film,SPM,surface energy gradient|
|Research Areas:||Combinatorial Methods, Nanometrology|
|PDF version:||Click here to retrieve PDF version of paper (484KB)|