Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Real Time Shape Evolution of Nanoimprinted Polymer Structures During Thermal Annealing

Published

Author(s)

Ronald L. Jones, T Hu, Christopher L. Soles, Eric K. Lin, R M. Reano, Stella W. Pang, D M. Casa

Abstract

The real time shape of nanoimprinted polymer patterns are measured as a function of annealing temperature and time using a new metrology technique, Critical Dimension Small Angle X-ray Scattering (CD-SAXS). Periodicity, linewidth, line height, and sidewall angle are reported both below and above the bulk glass transition temperature (TG) for a nanoimprinted line/space pattern of poly(methyl methacrylate) (PMMA). For T > TG, shape changes are accelerated in early stages due to the reduction of high energy corners, yielding to a slowed rate in longer time regimes.
Citation
Nano Letters
Volume
6
Issue
8

Keywords

dimensional metrology, glass transition temperature, Nanoimprint Lithography, nanomechanics, small angle x-ray scattering

Citation

Jones, R. , Hu, T. , Soles, C. , Lin, E. , Reano, R. , Pang, S. and Casa, D. (2006), Real Time Shape Evolution of Nanoimprinted Polymer Structures During Thermal Annealing, Nano Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852413 (Accessed April 18, 2024)
Created July 18, 2006, Updated February 19, 2017