NIST logo

Publication Citation: Direct Measurement of the Counterion Distribution Within Swollen Polyelectrolyte Films

NIST Authors in Bold

Author(s): Vivek M. Prabhu; B D. Vogt; Wen-Li Wu; Eric K. Lin; Jack F. Douglas; Sushil K. Satija; D L. Goldfarb; H Ito;
Title: Direct Measurement of the Counterion Distribution Within Swollen Polyelectrolyte Films
Published: July 19, 2005
Abstract: The depth profile of the counterion concentration within thin polyelectrolyte films was measured in situ using contrast variant specular neutron reflectivity to characterize the initial swelling stage of the film dissolution.Wefind substantial counterion depletion near the substrate and enrichment near the periphery of the film extending into the solution. These observations challenge our understanding of the charge distribution in polyelectrolyte films and are important for understanding film dissolution in medical and technological applications.
Citation: Langmuir
Volume: 21
Issue: 15
Pages: pp. 6647 - 6651
Keywords: aqueous base;dissolution;lithography;nanotechnology;neutron reflectivity;photoresist;polyelectrolyte;swelling;thin film
Research Areas: Polymers
PDF version: PDF Document Click here to retrieve PDF version of paper (165KB)