| Author(s): |
S D. Kim; A Sehgal; Alamgir Karim; Michael J. Fasolka; |
| Title: |
Techniques for Combinatorial and High-Throughput Microscopy. Part2: Automated Optical Microscopy Platform for Thin Films Research |
| Published: |
October 01, 2008 |
| Abstract: |
An automated optical microscopy system was developed for the high-throughput measurement of morphology evolution in combinatorial specimen libraries. Designed specifically for gradient thin film specimens, the platform was developed to track iso-parametric contour lines, control focus motors, regulate timing operations and perform image analysis. In addition, an example study on a fabricated gradient specimen concerning polymer thin film stability is discussed. |
| Citation: |
Microscopy Today |
| Volume: |
October 2008 |
| Keywords: |
combinatoral methods;film thickness;gradient libraries;hig-throughput materials science;surface energy gradient;temperature;thin films |
| Research Areas: |
Combinatorial Methods, Thin-Films |
| PDF version: |
 Click here to retrieve PDF version of paper (4MB) |
