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|Author(s):||S D. Kim; A Sehgal; Alamgir Karim; Michael J. Fasolka;|
|Title:||Techniques for Combinatorial and High-Throughput Microscopy. Part2: Automated Optical Microscopy Platform for Thin Films Research|
|Published:||October 01, 2008|
|Abstract:||An automated optical microscopy system was developed for the high-throughput measurement of morphology evolution in combinatorial specimen libraries. Designed specifically for gradient thin film specimens, the platform was developed to track iso-parametric contour lines, control focus motors, regulate timing operations and perform image analysis. In addition, an example study on a fabricated gradient specimen concerning polymer thin film stability is discussed.|
|Keywords:||combinatoral methods,film thickness,gradient libraries,hig-throughput materials science,surface energy gradient,temperature,thin films|
|Research Areas:||Combinatorial Methods, Thin-Films|
|PDF version:||Click here to retrieve PDF version of paper (4MB)|