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|Title:||Embedded Decoupling Capacitance Materials Characterization|
|Published:||December 01, 2000|
|Abstract:||The dielectric constant of the embedded capacitance materials was measured in the frequency range from 100 Hz to 5 GHz. The testing included evaluation of the capacitance density, leakage current, and the effect of HAST on the capacitance. A test specimen and test procedure have been designed for dielectric characterization of the embedded capacitance materials and used as common test vehicles to compare dielectric constant of High K films that have recently been developed by the industry. The objectives of NIST involvement in this NCMS-led project was to develop and evaluate a test method suitable for dielectric permittivity of high K polymer composite films that covers broader functional frequency range including the microwave.|
|Citation:||Embedded Decoupling Capacitance Project|
|Pages:||pp. 7-1 - 7-8|
|Keywords:||capacitor,dielectric constant,electronic,embedded,frequency,measurement,polymer,test pattern,thin film|
|PDF version:||Click here to retrieve PDF version of paper (295KB)|