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Publication Citation: Ferroelectric Distortion in SrTiO3 Thin Films on Si(001) by X-Ray Absorption Fine Structure: Experiment and First-Principles Calculations

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Author(s): Joseph C. Woicik; Eric L. Shirley; C S. Hellberg; S Sambasivan; Daniel A. Fischer; B D. Chapman; E A. Stern; P Ryan; D L. Ederer; H Li;
Title: Ferroelectric Distortion in SrTiO3 Thin Films on Si(001) by X-Ray Absorption Fine Structure: Experiment and First-Principles Calculations
Published: April 23, 2007
Abstract: Ti K and Ti L2,3 edge x-ray absorption fine-structure near-edge spectra of SrTiO3 thin films grown coherently on Si(001) reveal the presence of a ferroelectric (FE) distortion at room temperature. This unique phase is a direct consequence of the compressive biaxial strain achieved by coherent epitaxial growth. Comparisons with first-principles calculations support this conclusion.
Citation: Physical Review Letters
Volume: 89
Keywords: ferroelectric (FE) distortion;lattice constants;perovskites;SrTiO3
Research Areas: Characterization, Ceramics
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