| Author(s): |
Joseph C. Woicik; Eric L. Shirley; C S. Hellberg; S Sambasivan; Daniel A. Fischer; B D. Chapman; E A. Stern; P Ryan; D L. Ederer; H Li; |
| Title: |
Ferroelectric Distortion in SrTiO3 Thin Films on Si(001) by X-Ray Absorption Fine Structure: Experiment and First-Principles Calculations |
| Published: |
April 23, 2007 |
| Abstract: |
Ti K and Ti L2,3 edge x-ray absorption fine-structure near-edge spectra of SrTiO3 thin films grown coherently on Si(001) reveal the presence of a ferroelectric (FE) distortion at room temperature. This unique phase is a direct consequence of the compressive biaxial strain achieved by coherent epitaxial growth. Comparisons with first-principles calculations support this conclusion. |
| Citation: |
Physical Review Letters |
| Volume: |
89 |
| Keywords: |
ferroelectric (FE) distortion;lattice constants;perovskites;SrTiO3 |
| Research Areas: |
Characterization, Ceramics |
| PDF version: |
 Click here to retrieve PDF version of paper (711KB) |
