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|Author(s):||Joseph C. Woicik; Eric L. Shirley; C S. Hellberg; S Sambasivan; Daniel A. Fischer; B D. Chapman; E A. Stern; P Ryan; D L. Ederer; H Li;|
|Title:||Ferroelectric Distortion in SrTiO3 Thin Films on Si(001) by X-Ray Absorption Fine Structure: Experiment and First-Principles Calculations|
|Published:||April 23, 2007|
|Abstract:||Ti K and Ti L2,3 edge x-ray absorption fine-structure near-edge spectra of SrTiO3 thin films grown coherently on Si(001) reveal the presence of a ferroelectric (FE) distortion at room temperature. This unique phase is a direct consequence of the compressive biaxial strain achieved by coherent epitaxial growth. Comparisons with first-principles calculations support this conclusion.|
|Citation:||Physical Review Letters|
|Keywords:||ferroelectric (FE) distortion,lattice constants,perovskites,SrTiO3|
|Research Areas:||Characterization, Ceramics|
|PDF version:||Click here to retrieve PDF version of paper (728KB)|