Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||C E. Cox; Daniel A. Fischer; W G. Schwarz; Y Song;|
|Title:||Improvement in the Low Energy Collection Efficiency of Si(Li) X-Ray Detectors|
|Published:||April 07, 2005|
|Abstract:||Soft X-ray beam-line applications are of fundamental importance to material research, and commonly employ high-resolution Si(Li) detectors for Energy Dispersive Spectroscopy. However, the measurement of X-rays below 1 keV compromised by absorption in the material layers in front of the active crystal and a dead-layer at the crystal surface. Various Schottky barrier type contacts were investigated resulting in a 40% reduction of the dead-layer thickness and a factor of two increased sensitivity at carbon K compared to the standard Si(Li) detector. Si(Li) detectors were tested on the U7A soft X-ray beam-line at the National Synchrotron Light Source and on a Scanning Electron Microscope (SEM).|
|Citation:||Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms|
|Pages:||pp. 436 - 440|
|Keywords:||14-channel multi-element array detector,collection efficiency below 1keV,dead layer,Si(Li) detector|
|Research Areas:||Ceramics, Materials Science|