Publication Citation
NIST Authors in Bold
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| Author(s): | Joseph C. Woicik; F S. Aguirre-Tostado; A Herrera-Gomez; R Droopad; D G. Schlom; P Zschack; E Karapetrova; P Pianetta; |
|---|---|
| Title: | Elastic Anomaly in SrTiO3 Thin Films Grown on Si(001) |
| Published: | Date Unknown |
| Abstract: | |
| Conference: | ECS/ACerS Symposium on Interfaces in Electronic Materials |
| Dates: | October 12-17, 2003 |
| Keywords: | EXAFS;out-of-plalnd;polarization;STO;tensile;thin film growth |
| Research Areas: | Characterization, Ceramics |