NIST logo

Publication Citation: Elastic Anomaly in SrTiO3 Thin Films Grown on Si(001)

NIST Authors in Bold

Author(s): Joseph C. Woicik; F S. Aguirre-Tostado; A Herrera-Gomez; R Droopad; D G. Schlom; P Zschack; E Karapetrova; P Pianetta;
Title: Elastic Anomaly in SrTiO3 Thin Films Grown on Si(001)
Published: Date Unknown
Abstract:
Conference: ECS/ACerS Symposium on Interfaces in Electronic Materials
Dates: October 12-17, 2003
Keywords: EXAFS;out-of-plalnd;polarization;STO;tensile;thin film growth
Research Areas: Characterization, Ceramics