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|Author(s):||Winnie K. Wong-Ng; Igor Levin; Mark D. Vaudin; Ron Feenstra; Lawrence P. Cook; James P. Cline;|
|Title:||High-Temperature X-Ray Diffraction Study of Phase Evolution in Ba2YCu3O6+x Films Using the BaF2 Conversion Process|
|Abstract:||In-situ high-temperature x-ray diffraction (HTXRD) was used to study the phase formation and reaction kinetics of the Ba2Ycu3O6+x (Y-213) phase using the ex-situ BaF2 conversion process. Three sets of films on single crystal SrTiO3 substrates were prepared using e-beam co-evaporation technique of BaF2, Y and Cu targets. HTXRD studies were conducted on precursor films with thickness of 0.3 m and 1.0 m. The 0.3 m films showed mainly (00l) texture whereas the 1.0 m films showed a significant volume fraction of (h00) texture as well. A semi-quantitative estimate of the texture fraction was accomplished using the software TexturePlus. The growth of Y-213 and the consumption of BaF2 were found to beapproximately linear in time.|
|Citation:||Advances In X-Ray Analysis|
|Keywords:||Ba2YCu3O 6+x films,BaF2 process,coated conductors,high-temperature x-ray diffraction,phase formation,texture|
|Research Areas:||Ceramics, Characterization|