NIST logo

Publication Citation: Domain Pinning in Lead Zirconate Titanate Thin Films

NIST Authors in Bold

Author(s): J Blendell; Grady S. White;
Title: Domain Pinning in Lead Zirconate Titanate Thin Films
Published: Date Unknown
Abstract: Atomic force microscopy measurements of the piezoelectric response of a lead zirconate titanate (PZT) thin film detect domain pinning sites along grain boundaries. The locations of these sites are reproducible and 180 degrees domains appear to extend from or shrink into them. These results are interpreted in terms of grain misorientation-induced residual stresses playing a major role in domain pinning in PZT thin films.
Citation: Applied Physics Letters
Keywords: domain;ferroelectric;orientation;pinning;PZT;residual stress
Research Areas: Characterization, Ceramics