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|Author(s):||Mark D. Vaudin; Debra L. Kaiser;|
|Title:||Workshop on Texture in Electronic Applications|
|Published:||May 01, 2001|
|Abstract:||A two day workshop on Texture in Electronic Applications was held on October 10-11,2000 at NIST, Gaithersburg. The workshop presented an excellent forum for discussion of a broad spectrum of texture-related issues of interest to academic,government and industrial participants The need for a thin film texture standard was expressed and an informal round robin corrdinated by NIST will be started this year as a first step in the standards development process. In addition, NIST will evaluate the broader need for a Guide to Practice on texture measurement by conventional diffractometers. The group decided to hold a symposium on Texture and Microstructure in Electronic and Magnetic Films for the Materials Research Society Spring 2002 meeting.|
|Citation:||Journal of Research (NIST JRES) -|
|Volume:||106 No. 3|
|Keywords:||crystallographic texture,electronic applications,presentations,round table discussion,workshop|
|Research Areas:||Evaluation, Materials Science|