| Author(s): |
Mark D. Vaudin; Debra L. Kaiser; |
| Title: |
Workshop on Texture in Electronic Applications |
| Published: |
May 01, 2001 |
| Abstract: |
A two day workshop on Texture in Electronic Applications was held on October 10-11,2000 at NIST, Gaithersburg. The workshop presented an excellent forum for discussion of a broad spectrum of texture-related issues of interest to academic,government and industrial participants The need for a thin film texture standard was expressed and an informal round robin corrdinated by NIST will be started this year as a first step in the standards development process. In addition, NIST will evaluate the broader need for a Guide to Practice on texture measurement by conventional diffractometers. The group decided to hold a symposium on Texture and Microstructure in Electronic and Magnetic Films for the Materials Research Society Spring 2002 meeting. |
| Citation: |
Journal of Research (NIST JRES) - |
| Volume: |
106 No. 3 |
| Keywords: |
crystallographic texture;electronic applications;presentations;round table discussion;workshop |
| Research Areas: |
Evaluation, Materials Science |
