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|Author(s):||Mark D. Vaudin;|
|Published:||February 01, 2001|
|Abstract:||TexturePlus is a Win '95 or later software package that analyzes crystallographic texture in bulk and thin film specimens. The software analyzes data obtained on a powder x-ray diffractometer. The required data include an x-ray theta-2theta scan of a Bragg peak from the textured planes in a specimen, and a theta scan using this peak. Also needed are the diffractometer radius, the divergence of the incident beam, and, in the case of thin film specimens, the film thickness and the linear coefficient of x-ray absorption of the specimen. Output consists of the x-ray intensities, corrected for defocussing and absorption, which are directly related to the texture profile in units of multiples of a random distribution; these data can be written to ascii output files. Data concerning the profile of the Bragg peak (FWHM, area, integral breadth, etc.) are calculated and can be output in a spread-sheet friendly format. Tools are provided to integrate the texture (assumed axisymmetric) over a chosen angular range, to calculate simulated texture profiles based on a model texture function and to calculate a theta-offset theta-2theta scan of a Bragg peak for comparison with an experimental scan. The background of the Bragg peak can be set by the user, and the Bragg peak can be separated into the symmetric and asymmetric components. A capability to analyze chi-scan data obtained on a 4-circle diffractometer is also included.|
|Keywords:||bulk specimens,crystallographic texture,powder x-ray diffractometer,software package,thin film specimens|
|Research Areas:||Evaluation, Materials Science|