NIST Authors in Bold
| Author(s): | Jong S. Lee; Sheldon M. Wiederhorn; |
|---|---|
| Title: | Effects of Polarity on Grain Boundary Migration in ZnO |
| Published: | Date Unknown |
| Abstract: | Boundary migration of ZnO has been investigated using single crystals with defined crystallographic orientations. The migration rate of the basal C planes depended on the crystallographic polarity: Zn-terminated positive (0001)-planes. The migration in the non-polar directon was similar to that in the positive polarity direction. A ledge mechanism is suggested to be responsible for the grain boundary migration. These results explain the development of elongated grains in typical ZnO varistor ceramics. |
| Citation: | American Ceramic Society Bulletin |
| Keywords: | grain boundary migration;grain growth;zinc oxides;ZnO |
| Research Areas: | Characterization, Ceramics |