Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Jong S. Lee; Sheldon M. Wiederhorn;|
|Title:||Effects of Polarity on Grain Boundary Migration in ZnO|
|Abstract:||Boundary migration of ZnO has been investigated using single crystals with defined crystallographic orientations. The migration rate of the basal C planes depended on the crystallographic polarity: Zn-terminated positive (0001)-planes. The migration in the non-polar directon was similar to that in the positive polarity direction. A ledge mechanism is suggested to be responsible for the grain boundary migration. These results explain the development of elongated grains in typical ZnO varistor ceramics.|
|Citation:||American Ceramic Society Bulletin|
|Keywords:||grain boundary migration,grain growth,zinc oxides,ZnO|
|Research Areas:||Ceramics, Characterization|