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PUBLICATIONS

Half-life Measurements of Sr82

Published

Author(s)

Leticia S. Pibida, Ryan P. Fitzgerald, Michael P. Unterweger, Michelle M. Hammond, Daniel B. Golas

Abstract

Half-life measurements of 82Sr were performed at the National Institute of Standards and Technology (NIST) using gamma-ray spectrometry and a 4 pressurized ionization chamber. The 82Sr half-life was determined to be 25.36 ± 0.03 days (k=1) using the gamma-ray spectrometry system and 25.34 ± 0.02 days (k=1) using the 4 pi-gamma pressurized ionization chamber.
Citation
Applied Radiation and Isotopes
Volume
67
Pub Type
Journals

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Keywords

gamma-ray spectrometry, ionization chamber, Sr82
Nanometrology

Citation

Pibida, L. , Fitzgerald, R. , Unterweger, M. , Hammond, M. and Golas, D. (2009), Half-life Measurements of Sr82, Applied Radiation and Isotopes, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=842553 (Accessed April 26, 2024)

Created January 30, 2009, Updated February 19, 2017