| Author(s): |
Leticia S. Pibida; Ryan P. Fitzgerald; Michael P. Unterweger; Michelle M. Hammond; Daniel B. Golas; |
| Title: |
Half-life Measurements of Sr82 |
| Published: |
January 30, 2009 |
| Abstract: |
Half-life measurements of 82Sr were performed at the National Institute of Standards and Technology (NIST) using gamma-ray spectrometry and a 4 pressurized ionization chamber. The 82Sr half-life was determined to be 25.36 ± 0.03 days (k=1) using the gamma-ray spectrometry system and 25.34 ± 0.02 days (k=1) using the 4 pi-gamma pressurized ionization chamber. |
| Citation: |
Applied Radiation and Isotopes |
| Volume: |
67 |
| Pages: |
pp. 636 - 640 |
| Keywords: |
gamma-ray spectrometry; ionization chamber; Sr82 |
| Research Areas: |
Focused ion beam imaging (FIB) |
| PDF version: |
 Click here to retrieve PDF version of paper (280KB) |
