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Publication Citation: Half-life Measurements of Sr82

NIST Authors in Bold

Author(s): Leticia S. Pibida; Ryan P. Fitzgerald; Michael P. Unterweger; Michelle M. Hammond; Daniel B. Golas;
Title: Half-life Measurements of Sr82
Published: January 30, 2009
Abstract: Half-life measurements of 82Sr were performed at the National Institute of Standards and Technology (NIST) using gamma-ray spectrometry and a 4 pressurized ionization chamber. The 82Sr half-life was determined to be 25.36 ± 0.03 days (k=1) using the gamma-ray spectrometry system and 25.34 ± 0.02 days (k=1) using the 4 pi-gamma pressurized ionization chamber.
Citation: Applied Radiation and Isotopes
Volume: 67
Pages: pp. 636 - 640
Keywords: gamma-ray spectrometry, ionization chamber, Sr82
Research Areas: Focused ion beam imaging (FIB)
PDF version: PDF Document Click here to retrieve PDF version of paper (287KB)