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|Author(s):||Simon G. Kaplan; Leonard M. Hanssen; Alan L. Migdall; G Lefever-Button;|
|Title:||Characterization of High-OD Ultrathin Infrared Neutral Density Filters|
|Published:||October 08, 1998|
|Abstract:||We have performed transmittance measurements of metal-film neutral density filters on ultrathin polymer substrates using both Fourier-transform infrared spectrometer and laser-based (3.39 mm and 10.6 mm) systems. The use of ultrathin substrates, free of etaloning effects over the 2 mm to 20 mm spectral range, allows the FT-IR and laser measurements to be directly compared. We discuss the evaluation of the uncertainties in the transmittance values in both types of systems.|
|Research Areas:||Quantum Optics|
|DOI:||http://dx.doi.org/10.1117/12.326679 (Note: May link to a non-U.S. Government webpage)|
|PDF version:||Click here to retrieve PDF version of paper (296KB)|