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Publication Citation: Characterization of High-OD Ultrathin Infrared Neutral Density Filters

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Author(s): Simon G. Kaplan; Leonard M. Hanssen; Alan L. Migdall; G Lefever-Button;
Title: Characterization of High-OD Ultrathin Infrared Neutral Density Filters
Published: October 08, 1998
Abstract: We have performed transmittance measurements of metal-film neutral density filters on ultrathin polymer substrates using both Fourier-transform infrared spectrometer and laser-based (3.39 mm and 10.6 mm) systems. The use of ultrathin substrates, free of etaloning effects over the 2 mm to 20 mm spectral range, allows the FT-IR and laser measurements to be directly compared. We discuss the evaluation of the uncertainties in the transmittance values in both types of systems.
Citation: SPIE series
Pages: 8 pp.
Keywords: infrared,neutral-density filter,transmittance
Research Areas: Quantum Optics
DOI: http://dx.doi.org/10.1117/12.326679  (Note: May link to a non-U.S. Government webpage)
PDF version: PDF Document Click here to retrieve PDF version of paper (296KB)