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Publication Citation: Trapping Highly Charged Ions: Fundamentals and Applications

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Author(s): John D. Gillaspy;
Title: Trapping Highly Charged Ions: Fundamentals and Applications
Published: April 01, 2000
Abstract: Fundamentals and applications for trapping highly charged ions.
Citation: Trapping Highly Charged Ions: Fundamentals and Applications
Publisher: Nova Publisher, Hauppauge, NY
Keywords: atoms;EBIT;electron beam ion trap;highly charged atoms
Research Areas: Physics