Publication Citation
NIST Authors in Bold
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| Author(s): | John D. Gillaspy; |
|---|---|
| Title: | Trapping Highly Charged Ions: Fundamentals and Applications |
| Published: | April 01, 2000 |
| Abstract: | Fundamentals and applications for trapping highly charged ions. |
| Citation: | Trapping Highly Charged Ions: Fundamentals and Applications |
| Publisher: | Nova Publisher, Hauppauge, NY |
| Keywords: | atoms;EBIT;electron beam ion trap;highly charged atoms |
| Research Areas: | Physics |