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Publication Citation: Surface Potential Imaging of Solution Processable Acene-Based Thin Film Transistors

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Author(s): Lucile C. Teague; Behrang H. Hamadani; John E. Anthony; David J. Gundlach; James G. Kushmerick; Sanker Subramanian; Thomas Jackson; Curt A. Richter; Oana Jurchescu;
Title: Surface Potential Imaging of Solution Processable Acene-Based Thin Film Transistors
Published: December 02, 2008
Abstract: We report scanning Kelvin probe microscopy (SKPM) of electrically biased difluoro bis(triethylsilylethynyl) anthradithiophene (diF-TESADT) organic thin film transistors. SKPM reveals the relationship between the diF-TESADT film structure and device performance. In these devices charge transport is limited by the structure and interaction of the diF-TESADT grains within the active portion of the device rather than by the electrical contacts between the organic semiconductor and the source and drain electrodes.
Citation: Advanced Materials
Volume: 20
Pages: pp. 4513 - 4516
Keywords: "molecular electronics";"nanotechnology"
Research Areas: Nanotechnology, Nanoelectronics and Nanoscale Electronics
PDF version: PDF Document Click here to retrieve PDF version of paper (352KB)