| Author(s): |
Lucile C. Teague; Behrang H. Hamadani; John E. Anthony; David J. Gundlach; James G. Kushmerick; Sanker Subramanian; Thomas Jackson; Curt A. Richter; Oana Jurchescu; |
| Title: |
Surface Potential Imaging of Solution Processable Acene-Based Thin Film Transistors |
| Published: |
December 02, 2008 |
| Abstract: |
We report scanning Kelvin probe microscopy (SKPM) of electrically biased difluoro bis(triethylsilylethynyl) anthradithiophene (diF-TESADT) organic thin film transistors. SKPM reveals the relationship between the diF-TESADT film structure and device performance. In these devices charge transport is limited by the structure and interaction of the diF-TESADT grains within the active portion of the device rather than by the electrical contacts between the organic semiconductor and the source and drain electrodes. |
| Citation: |
Advanced Materials |
| Volume: |
20 |
| Pages: |
pp. 4513 - 4516 |
| Keywords: |
"molecular electronics";"nanotechnology" |
| Research Areas: |
Nanotechnology, Nanoelectronics and Nanoscale Electronics |
| PDF version: |
 Click here to retrieve PDF version of paper (344KB) |
