Publication Citation
NIST Authors in Bold
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| Author(s): | Nicholas W. Ritchie; |
|---|---|
| Title: | A New Monte Carlo Application for Complex Sample Geometries |
| Published: | November 01, 2005 |
| Abstract: | |
| Citation: | Surface and Interface Analysis |
| Keywords: | backscatter;electron beam;electron probe microanalysis;electron transport;Monte Carlo;SEM;spectrometry;x-ray |
| Research Areas: | Nanotechnology |