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Publication Citation: A New Monte Carlo Application for Complex Sample Geometries

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Author(s): Nicholas W. Ritchie;
Title: A New Monte Carlo Application for Complex Sample Geometries
Published: November 01, 2005
Abstract:
Citation: Surface and Interface Analysis
Keywords: backscatter,electron beam,electron probe microanalysis,electron transport,Monte Carlo,SEM,spectrometry,x-ray
Research Areas: Nanotechnology
PDF version: PDF Document Click here to retrieve PDF version of paper (211KB)