NIST logo

Publication Citation: A New Monte Carlo Application for Complex Sample Geometries

NIST Authors in Bold

Author(s): Nicholas W. Ritchie;
Title: A New Monte Carlo Application for Complex Sample Geometries
Published: November 01, 2005
Abstract:
Citation: Surface and Interface Analysis
Keywords: backscatter;electron beam;electron probe microanalysis;electron transport;Monte Carlo;SEM;spectrometry;x-ray
Research Areas: Nanotechnology
PDF version: PDF Document Click here to retrieve PDF version of paper (211KB)