NIST logo

Publication Citation: Automated Analysis of Organic Particles Using Cluster SIMS

NIST Authors in Bold

Author(s): John G. Gillen; Cynthia J. Zeissler; Christine M. Mahoney; Abigail P. Lindstrom; Robert A. Fletcher; P Chi; Jennifer R. Verkouteren; David S. Bright; R Lareau; M Boldman;
Title: Automated Analysis of Organic Particles Using Cluster SIMS
Published: June 01, 2004
Abstract: Cluster primary ion bombardment combined with secondary ion imaging is used in an ion microscope secondary ion mass spectrometer for the spatially resolved analysis of organic particles on various surfaces. Compared to the use of monoatomic primary ion beam bombardment, the use of a cluster primary ion beam (SF5+ or C8-) provides significant improvement in molecular ion yields and a reduction in beam-induced degradation of the analyte molecules. These characteristics of cluster bombardment are utilized, along with automated sample stage control and custom image analysis software, to rapidly characterize the spatial distribution of trace explosive particles, narcotics and inkjet-printed micro arrays on a variety of surfaces.
Citation: Applied Surface Science
Volume: 231-232
Issue: Sp.
Keywords: cluster SIMS;explosives;inkjet;particle searching;polyatomic ion
Research Areas: Nanotechnology, Chemistry