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Publication Citation: Multispectral Probes for Materials and Chemical Analysis

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Author(s): Steven A. Buntin;
Title: Multispectral Probes for Materials and Chemical Analysis
Published: October 01, 2001
Abstract: High throughput experimentation is currently restricted by its limited ability to evaluate more than one parameter of a library at a time (e.g., chemical composition, dielectric constant, refractive index, surface roughness, phase , luminescence). When compared to the highly parallel synthetic strategies used to generate combinatorial libraries, the serial screening processes may ultimately limit the obtainable throughput of a combinatorial method. With the ability to rapidly prepare complex libraries to support a broad range of performance attributes, it will become increasingly valuable to be able to collect performance and compositional information simultaneously thereby gaining a multiplex/multichannel advantage. To this end, NIST is developing measurement platforms that exploit non-contact, multi-tasked microscopies and spectroscopies. Our work focuses on the development of ultra-broadband scanning evanscent probe microscopy and spectroscopy; this instrumentation will target the ability to simultaneously measure a set of compositional and performance properties of chemically testured samples. Results for variable-composition oxide and polymeric samples will be highlighted.
Conference: CombiCat 2001 Conference
Proceedings: MULTISPECTRAL PROBES FOR MATERIALS AND CHEMICAL ANALYSIS
Location: Philadelphia, PA
Dates: November 16, 2001
Keywords: combinatorial chemistry/catalyst;high throughput experimentation;hyperspectral imaging;infrared;NSOM;Raman;scanned probe
Research Areas: Chemistry