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|Author(s):||P T. Wilson; Kimberly A. Briggman; John C. Stephenson; William E. Wallace; Lee J. Richter;|
|Title:||Molecular Order at Polymer Interfaces Measured by Broad-Bandwidth Vibrationally Resolved Sum Frequency Generation Spectroscopy|
|Published:||April 23, 2001|
|Abstract:||Broad-bandwidth vibrationally-resolved sum frequency generation spectroscopy has been used to measure the molecular orientation distribution at polystyrene/dielectric interfaces. A novel microcavity structure allows isolation of the free or buried interface and reveals opposite absolute orientations.|
|Conference:||Quantum Electronics and Laser Science Conference (QELS 2001)|
|Proceedings:||Trends in Optics and Photonics|
|Pages:||pp. 189 - 190|
|Keywords:||interface,nonlinear optics,polymer,surface spectroscopy|
|Research Areas:||Characterization, Optical Technology, Polymers, Nonlinear Optical Spectroscopy|
|PDF version:||Click here to retrieve PDF version of paper (133KB)|