| Author(s): |
P T. Wilson; Kimberly A. Briggman; John C. Stephenson; William E. Wallace III; Lee J. Richter; |
| Title: |
Molecular Order at Polymer Interfaces Measured by Broad-Bandwidth Vibrationally Resolved Sum Frequency Generation Spectroscopy |
| Published: |
April 23, 2001 |
| Abstract: |
Broad-bandwidth vibrationally-resolved sum frequency generation spectroscopy has been used to measure the molecular orientation distribution at polystyrene/dielectric interfaces. A novel microcavity structure allows isolation of the free or buried interface and reveals opposite absolute orientations. |
| Conference: |
Quantum Electronics and Laser Science Conference (QELS 2001) |
| Proceedings: |
Trends in Optics and Photonics |
| Volume: |
57 |
| Issue: |
June 2001 |
| Pages: |
pp. 189 - 190 |
| Location: |
Washington, DC |
| Keywords: |
interface;nonlinear optics;polymer;surface spectroscopy |
| Research Areas: |
Polymers, Characterization, Nonlinear Optical Spectroscopy, Optical Technology |
| PDF version: |
 Click here to retrieve PDF version of paper (130KB) |
