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Publication Citation: NIST Data Resources for Surface Analysis by X-Ray Photoelectron Spectroscopy and Auger Electron Spectroscopy

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Author(s): Cedric J. Powell; Aleksander Jablonski; A Naumkin; A Kraut-Vass; Joseph M. Conny; J R. Rumble;
Title: NIST Data Resources for Surface Analysis by X-Ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
Published: March 01, 2001
Abstract: A description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for x-ray photoelectron spectroscopy (XPS) and Auger-electron spectroscopy. NIST currently has three databases available: an XPS Database, an Electron Elastic-Scattering Cross-Section Database, and an Electron Inelastic-Mean-Free-Path Database. NIST also offers Standard Test Data (STD) for XPS, a set of simulated XPS data designed to evaluate algorithms and procedures for detecting, locating, and measuring the intensities of overlapping peaks in a doublet. The XPS database and the XPS-STD are available over the internet.
Proceedings: ICESS-8 - 8th International Conference on Electronic Spectroscopy & Structure Journal of Electron Spectroscopy and Related Phenomena
Volume: 114-116
Pages: pp. 1097 - 1102
Location: Berkeley, CA
Dates: August 8-12, 2000
Keywords: Auger-electron spectroscopy;databases;electron elastic-scattering cross sectio;electron inelastic mean free paths;standard test data;surface analysis;x-ray photoelectron spectroscopy
Research Areas: Spectroscopy, Chemistry