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|Author(s):||Cedric J. Powell; Aleksander Jablonski; A Naumkin; A Kraut-Vass; Joseph M. Conny; J R. Rumble;|
|Title:||NIST Data Resources for Surface Analysis by X-Ray Photoelectron Spectroscopy and Auger Electron Spectroscopy|
|Published:||March 01, 2001|
|Abstract:||A description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for x-ray photoelectron spectroscopy (XPS) and Auger-electron spectroscopy. NIST currently has three databases available: an XPS Database, an Electron Elastic-Scattering Cross-Section Database, and an Electron Inelastic-Mean-Free-Path Database. NIST also offers Standard Test Data (STD) for XPS, a set of simulated XPS data designed to evaluate algorithms and procedures for detecting, locating, and measuring the intensities of overlapping peaks in a doublet. The XPS database and the XPS-STD are available over the internet.|
|Proceedings:||ICESS-8 - 8th International Conference on Electronic Spectroscopy & Structure Journal of Electron Spectroscopy and Related Phenomena|
|Pages:||pp. 1097 - 1102|
|Dates:||August 8-12, 2000|
|Keywords:||Auger-electron spectroscopy,databases,electron elastic-scattering cross sectio,electron inelastic mean free paths,standard test data,surface analysis,x-ray photoelectron spectroscopy|
|Research Areas:||Spectroscopy, Chemistry|