| Author(s): |
Cedric J. Powell; Aleksander Jablonski; A Naumkin; A Kraut-Vass; Joseph M. Conny; J R. Rumble; |
| Title: |
NIST Data Resources for Surface Analysis by X-Ray Photoelectron Spectroscopy and Auger Electron Spectroscopy |
| Published: |
March 01, 2001 |
| Abstract: |
A description is given of data resources that are available from the National Institute of Standards and Technology (NIST) for x-ray photoelectron spectroscopy (XPS) and Auger-electron spectroscopy. NIST currently has three databases available: an XPS Database, an Electron Elastic-Scattering Cross-Section Database, and an Electron Inelastic-Mean-Free-Path Database. NIST also offers Standard Test Data (STD) for XPS, a set of simulated XPS data designed to evaluate algorithms and procedures for detecting, locating, and measuring the intensities of overlapping peaks in a doublet. The XPS database and the XPS-STD are available over the internet. |
| Proceedings: |
ICESS-8 - 8th International Conference on Electronic Spectroscopy & Structure
Journal of Electron Spectroscopy and Related Phenomena |
| Volume: |
114-116 |
| Pages: |
pp. 1097 - 1102 |
| Location: |
Berkeley, CA |
| Dates: |
August 8-12, 2000 |
| Keywords: |
Auger-electron spectroscopy;databases;electron elastic-scattering cross sectio;electron inelastic mean free paths;standard test data;surface analysis;x-ray photoelectron spectroscopy |
| Research Areas: |
Spectroscopy, Chemistry |
