NIST logo

Publication Citation: Phosphor Imaging Plate Measurement of Electron Scattering in the Environmental Scanning Electron Microscope

NIST Authors in Bold

Author(s): Scott A. Wight; Cynthia J. Zeissler;
Title: Phosphor Imaging Plate Measurement of Electron Scattering in the Environmental Scanning Electron Microscope
Published: August 01, 2000
Abstract: Phosphor Imaging Plate Technology is applied to electron beam scattering in the Environmental Scanning Electron Microscope. The plate is exposed to primary and scattered electrons which stimulate the phosphor grains to an excited state. The intensity of the grains upon reading gives a visual representation of where electrons struck the plate. This direct measurement of electron scatter is important to improving models and analytical correction procedures.
Conference: Microscopy and Microanalysis Society
Proceedings: Microscopy and Microanalysis 2000 Meeting; Microscopy and Microanalysis 2000, Annual Meeting | 58th | | Springer
Volume: 6
Issue: Suppl. 2
Location: xxxx, -1
Dates: August 1, 2000
Keywords: electron;ESEM;imaging;phosphor;plate;scattering
Research Areas: Nanotechnology, Chemistry