| Author(s): |
Scott A. Wight; Cynthia J. Zeissler; |
| Title: |
Phosphor Imaging Plate Measurement of Electron Scattering in the Environmental Scanning Electron Microscope |
| Published: |
August 01, 2000 |
| Abstract: |
Phosphor Imaging Plate Technology is applied to electron beam scattering in the Environmental Scanning Electron Microscope. The plate is exposed to primary and scattered electrons which stimulate the phosphor grains to an excited state. The intensity of the grains upon reading gives a visual representation of where electrons struck the plate. This direct measurement of electron scatter is important to improving models and analytical correction procedures. |
| Conference: |
Microscopy and Microanalysis Society |
| Proceedings: |
Microscopy and Microanalysis 2000 Meeting; Microscopy and Microanalysis 2000, Annual Meeting | 58th | | Springer |
| Volume: |
6 |
| Issue: |
Suppl. 2 |
| Location: |
xxxx, -1 |
| Dates: |
August 1, 2000 |
| Keywords: |
electron;ESEM;imaging;phosphor;plate;scattering |
| Research Areas: |
Nanotechnology, Chemistry |
