Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Scott A. Wight; Cynthia J. Zeissler;|
|Title:||Direct Measurement of Electron Beam Scattering in the Environmental Scanning Electron Microscope Using Phosphor Imaging Plates|
|Published:||May 01, 2000|
|Abstract:||Phosphor imaging plate technology has made it possible to directly image the distribution of primary beam electrons and scattered electrons in the environmental scanning electron microscope. The phosphor plate is exposed under electron scattering conditions in the microscope chamber. When processed, the electron intensity distribution is displayed as a digital image. The image is a visual representation of the electron probe and skirt and may provide the basis for a more accurate model.|
|Pages:||pp. 167 - 172|
|Keywords:||electron scattering,environmental scanning electron microsco,phosphor imaging plates,photostimulable|
|Research Areas:||Chemistry, Nanotechnology|