NIST logo

Publication Citation: Direct Measurement of Electron Beam Scattering in the Environmental Scanning Electron Microscope Using Phosphor Imaging Plates

NIST Authors in Bold

Author(s): Scott A. Wight; Cynthia J. Zeissler;
Title: Direct Measurement of Electron Beam Scattering in the Environmental Scanning Electron Microscope Using Phosphor Imaging Plates
Published: May 01, 2000
Abstract: Phosphor imaging plate technology has made it possible to directly image the distribution of primary beam electrons and scattered electrons in the environmental scanning electron microscope. The phosphor plate is exposed under electron scattering conditions in the microscope chamber. When processed, the electron intensity distribution is displayed as a digital image. The image is a visual representation of the electron probe and skirt and may provide the basis for a more accurate model.
Citation: Scanning
Volume: 22
Issue: No. 3
Pages: pp. 167 - 172
Keywords: electron scattering;environmental scanning electron microsco;phosphor imaging plates;photostimulable
Research Areas: Nanotechnology, Chemistry