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NIST Authors in Bold
|Author(s):||Scott A. Wight;|
|Title:||What Do We Need to Look Out for When Doing Energy Dispersive X-Ray Analysis in the Environmental Scanning Electron Microscope?|
|Published:||August 01, 1999|
|Abstract:||Electron scattering in the environmental scanning electron microscope may contribute x-ray contamination to quantitative analysis. A series of experiments explores at what range and conditions the analyst in the real world needs to be concerned about these unwanted contributions.|
|Citation:||Microscopy and Microanalysis|
|Pages:||pp. 290 - 291|
|Keywords:||energy dispersive spectrometry,environmental SEM,quantitative analysis,scanning electron microscope|
|Research Areas:||Nanotechnology, Chemistry|