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Publication Citation: What Do We Need to Look Out for When Doing Energy Dispersive X-Ray Analysis in the Environmental Scanning Electron Microscope?

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Author(s): Scott A. Wight;
Title: What Do We Need to Look Out for When Doing Energy Dispersive X-Ray Analysis in the Environmental Scanning Electron Microscope?
Published: August 01, 1999
Abstract: Electron scattering in the environmental scanning electron microscope may contribute x-ray contamination to quantitative analysis. A series of experiments explores at what range and conditions the analyst in the real world needs to be concerned about these unwanted contributions.
Citation: Microscopy and Microanalysis
Volume: 5
Pages: pp. 290 - 291
Keywords: energy dispersive spectrometry;environmental SEM;quantitative analysis;scanning electron microscope
Research Areas: Nanotechnology, Chemistry