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|Author(s):||David S. Bright;|
|Title:||Fractal Dimension of Particle Outlines: Meaning, Utility, Limitations, Standard Images and Examples|
|Published:||April 01, 1999|
|Abstract:||Only a handful of shape parameters, such as aspect ratio and circularity, are in common use for characterizing individual microscopic particles. The fractal dimension, D, is seeing increased use as an additional shape parameter because particle shapes often exhibit fractal-like behavior. further, D characterizes the dependence of the perimeter on step size, avoiding the disadvantage of using the perimetr alone, due to its strong sensitivity to image resolution. This talk concerns the implementation and evaluation of two computer methods of measuring D. I will present results of testing the methods on a large set of computer-generated fractals, on images of scanned tree leaves, and on electron micrographs of abrasives and soil particles.|
|Proceedings:||Condition Monitoring, International Conference | | | Coxmoor Publishing|
|Pages:||pp. 565 - 575|
|Dates:||April 1, 1999|
|Keywords:||digital image processing,fractal dimension,particle outlines,particle shape|
|Research Areas:||Nanotechnology, Chemistry|