NIST logo

Publication Citation: Reducing Thermal Noise in Molecular Force Spectroscopy

NIST Authors in Bold

Author(s): Gordon A. Shaw;
Title: Reducing Thermal Noise in Molecular Force Spectroscopy
Published: June 02, 2008
Abstract: Molecular force spectroscopy is the practice of testing the mechanical properties of single molecules.  The precision determination of these properties requires an instrument capable of piconewton-level force measurement.  The atomic force microscope (AFM) is capable of such measurements if experiments are performed carefully.  One factor limiting the force measurement resolution of the AFM in wet chemical environments is the presence of a squeeze film damper between the microfabricated cantilever used for force measurement and the surface to which the molecules of interest are attached.  The effect of this damping on the force sensor s thermal noise is examined, and a new method is proposed to reduce this noise at low frequency by using a micropipette.
Proceedings: Proceedings of the Society for Experimental Mechanics Annual Meeting Orlando, FL, 2008
Pages: 6 pp.
Location: Orlando, FL
Dates: June 2-5, 2008
Keywords: force; metrology; nanotechnology; scanning probe microscopy; single molecule measurement
Research Areas: Nanomanufacturing
PDF version: PDF Document Click here to retrieve PDF version of paper (982KB)