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NIST Authors in Bold
|Author(s):||Steven D. Phillips;|
|Title:||Measurement Uncertainty, CMMs, and Standards: Today and the Future|
|Published:||January 01, 2005|
|Abstract:||Over the past decade modern measurement uncertainty evaluation has evolved from an obscure art practiced at National Measurement Institutes (NMIs) to an increasingly intertwined aspect of industrial metrology. This paper examines the progression of measurement uncertainty from the NMIs to the calibration laboratories and onto the shop floor. National and international standards relevant to uncertainty considerations are described.|
|Conference:||2005 International Dimensional Workshop|
|Proceedings:||Proceedings of 2005 International Dimensional Workshop|
|Dates:||May 9-13, 2005|
|Research Areas:||Metrology, Manufacturing|