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Publication Citation: Multi-Probe Assembly

NIST Authors in Bold

Author(s): John Wason; William Gressick; J Wen; Jason J. Gorman; Nicholas G. Dagalakis;
Title: Multi-Probe Assembly
Published: December 31, 2007
Abstract: This paper describes the algorithm development and experimental results of a multi-probe micro-assembly system. The experimental testbed consists of two actuated probes, an actuated die stage, and vision feedback. The kinematics relationships for the probes, die stage, and part manipulation are derived and used for calibration and kinematics-based planning and control. Particular attention has been focused on the effect of adhesion forces in probe-part and partstage contacts in order to achieve grasp stability and robust part manipulation. By combining pre-planned manipulation sequences and vision based manipulation, repeatable spatial (in contrast to planar) manipulation and insertion of a submillimeter part has been demonstrated. The insertion process only requires the operator to identify two features to initialize the calibration, and the remaining tasks involving part pick-up, manipulation, and insertion are all performed autonomously.
Proceedings: 3rd Annual IEEE Conference on Automation Science and Engineering (CASE 2007)
Pages: 6 pp.
Location: Scottsdale, AZ
Dates: September 22-25, 2007
Keywords: MEMS,microassembly,microprobe
Research Areas: Nanotechnology
PDF version: PDF Document Click here to retrieve PDF version of paper (439KB)