| Abstract: |
An International Metrology Interoperability Summit (IMIS) was held March 28 - 30, 2006 at NIST in Gaithersburg, MD. Workers and decision makers in a variety of dimensional metrology corporations and organizations worldwide participated. The first day consisted of a series of lectures updating newcomers on the nature of the various dimensional metrology component interface standards efforts. During the second and third days of the summit, participants divided up into four different domains: Design, Planning, Execution, and Reporting. Each group was tasked to articulate and prioritize issues, solutions, and actions in their domain. Each issue was decomposed into potentially multiple solutions, and each solution into potentially multiple actions. Issues were also prioritized, both within each group and by all IMIS participants. Key issues identified of the highest importance where intellectual property concerns, need for standardization, and the need for an open, non-proprietary standard for the interface between part design and process planning. |
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