Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publication Citation: Application of Carbon Nanotube Probes in a Critical Dimension Atomic Force Microscope

NIST Authors in Bold

Author(s): B C. Park; J Choi; S J. Ahn; D H. Kim; L Joon; Ronald G. Dixson; Ndubuisi G. Orji; Joseph Fu; Theodore V. Vorburger;
Title: Application of Carbon Nanotube Probes in a Critical Dimension Atomic Force Microscope
Published: March 01, 2007
Abstract: The ever decreasing size of semiconductor features demands the advancement of critical dimension atomic force microscope (CD-AFM) technology, for which the fabrication and use of more ideal probes like carbon nanotubes (CNT) is of considerable interest. The recent progress in the precise control of CNT orientation, length, and end modification, using manipulation and focused ion beam processes, allowed us to implement ball-capped CNT tips and bent CNT tips for CD-AFM. Such CNT tips have been tested for the first time in a commercial CD-AFM to image a grating and line edge roughness samples. We found out that CNT tips can reasonably scan the pattern profiles including re-entrant sidewalls with the CNT tip geometries we used and with the available range of scan parameters. There still remain important issues to address - including tighter control of tip geometry and optimization of scan parameters and algorithms for using CNT tips.
Conference: Metrology, Inspection, and Process Control for Microlithography XXI, Chas N. Archie, Editor
Proceedings: Proceedings of SPIE
Volume: 6518
Pages: pp. 651819-1 - 651819-14
Location: San Jose, CA
Dates: February 26, 2007
Keywords: atomic force microscope (AFM), carbon nanotube (CNT) tip, nano-manipulation, ion beam bending (IBB), ion beam induced deposition (IBID), critical dimension (CD) metrology
Research Areas: Metrology, Manufacturing