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|Author(s):||Jarred C. Heigel; Robert W. Ivester; Eric P. Whitenton;|
|Title:||Cutting Temperature Measurements of Segmented Chips using Dual-Spectrum High-Speed Microvideography|
|Published:||May 20, 2008|
|Abstract:||Dual-Spectrum high speed microvideography involves the use of synchronized high speed visible light (30,000 frames/s) and infrared (600 frames/s) cameras. This paper presents analysis method and results of such a system to determine chip temperatures during during orthogonal cutting of American Iron and Steel Institute 1045 steel with coated carbide tool. Speeds from 200-600 m/min at a feeds of 0.15 mm/rev and 0.30 mm/rev represent industrially relevant cutting conditions. Obtaining temperature measurements on precise points of the chip by using the visible light images to navigate the infrared images proves to be advantageous.|
|Citation:||Transactional Analysis Journal|
|Pages:||pp. 73 - 80|
|Keywords:||Temperature measurement, carbide tooling, turning, dual spectrum, microvideography|
|Research Areas:||Metrology and Standards for Manufacturing Processes|
|PDF version:||Click here to retrieve PDF version of paper (272KB)|