| Author(s): |
Jarred C. Heigel; Robert W. Ivester; Eric P. Whitenton; |
| Title: |
Cutting Temperature Measurements of Segmented Chips using Dual-Spectrum High-Speed Microvideography |
| Published: |
May 20, 2008 |
| Abstract: |
Dual-Spectrum high speed microvideography involves the use of synchronized high speed visible light (30,000 frames/s) and infrared (600 frames/s) cameras. This paper presents analysis method and results of such a system to determine chip temperatures during during orthogonal cutting of American Iron and Steel Institute 1045 steel with coated carbide tool. Speeds from 200-600 m/min at a feeds of 0.15 mm/rev and 0.30 mm/rev represent industrially relevant cutting conditions. Obtaining temperature measurements on precise points of the chip by using the visible light images to navigate the infrared images proves to be advantageous. |
| Citation: |
Transactional Analysis Journal |
| Volume: |
36 |
| Pages: |
pp. 73 - 80 |
| Keywords: |
Temperature measurement, carbide tooling, turning, dual spectrum, microvideography |
| Research Areas: |
Metrology and Standards for Manufacturing Processes |
| PDF version: |
 Click here to retrieve PDF version of paper (265KB) |
