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NIST Authors in Bold
|Author(s):||Egon Marx; James E. Potzick;|
|Title:||Simulation of Optical Microscope Images for Photomask Feature Size Measurements|
|Published:||July 03, 2005|
|Abstract:||Features on photomasks used in the semiconductor industry have steadily decreased in size to fit more elements on a wafer. When the size becomes smaller than the wavelength of the light used in a microscope, simulation becomes an important part of the measurement process because the image does not otherwise yield an accurate value of the dimension being measured. The integral equation form of Maxwell's equations is used in the simulation process described here.|
|Conference:||2005 Digest of IEEE Antennas and Propagation Society International Symposium|
|Pages:||pp. 2116 - 2119|
|Dates:||July 3-8, 2005|
|Keywords:||linewidth metrology,Maxwell',s equations,optical image modeling,photomasks|
|Research Areas:||Manufacturing, Metrology|